Ключевые слова: presentation, HTS, coated conductors, seed layers, magnetron sputtering, buffer layers, fabrication, high rate process, IBAD process, homogeneity, texture, long conductors
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Rar A., Schmidt R., Marchevsky M.
Foltyn S.R., Jia Q.X., DePaula R.F., Stan L., Holesinger T.G., Civale L., Maiorov B., Selvamanickam V., Feldmann D.M., Chen Y., Usov I.O.
Weijers H.W., Larbalestier D.C., Selvamanickam V., Hazelton D.W., Holtz R.L., Markiewicz W.D., Duval J.M.
Xiong X., Qiao Y., Knoll A., Selvamanickam V., Xie Y.Y., Chen Y., Weber C.S., Lenseth K.P., Schmidt R.M., Rar A., Marchevsky M.
Ключевые слова: HTS, coated conductors, IBAD process, buffer layers, high rate process, long conductors, pilot-scale, fabrication, length, quality control
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Gogia B., Marchevsky M., Pethuraja G., Dutta P.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Ключевые слова: HTS, YBCO, coated conductors, quench properties, measurement technique, quench detection
Ключевые слова: HTS, YBCO, coated conductors, presentation, review, fabrication, critical current, thickness dependence, IBAD process, MOCVD process, Jc/B curves, mechanical properties, commercialization, high rate process, power transmission lines, cables three-in-one, ac losses, fault currents, recovery characteristics, Roebel conductors, coils, collaborations, power equipment, critical caracteristics, substrate Hastelloy
Selvamanickam V.(selva@igc.com), Xiong X., Hazelton D.W., Zhang X., Tekletsadik K., Xie Y.-Y, Lenseth K.P., Schmidt R.M., Qiao Y.(yqiao@igc.com)
Ключевые слова: coated conductors, review, YBCO, coils pancake, IBAD process, MOCVD process, FCL resistive, HTS, power equipment, fabrication
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, fabrication, microstructure, buffer layers, high rate process, critical current, thickness dependence, oxygenation treatments, REBCO, magnetic field dependence, critical current density, Jc/B curves, angular dependence, texture, nanodots, pinning, critical caracteristics
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, MOCVD process, IBAD process, REBCO, texture, critical current density, angular dependence, magnetic field dependence, microstructure, interfaces, nucleation, buffer layers, critical current, thickness dependence, long conductors, homogeneity, critical caracteristics
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Ключевые слова: presentation, HTS, coated conductors, YBCO, cables three-in-one, current-voltage characteristics, ac losses, coils insert, design parameters, critical current, MOCVD process, thickness dependence, hot spots, high rate process, texture, power equipment, critical caracteristics, fabrication
Xiong X., Qiao Y., Reeves J., Xie Y., Lenseth K., Selvamanickam V., Zhang X., Rar A., Schmidt R., Martchevskii M., Chen P.Y., Herrin D.H.
Ключевые слова: presentation, HTS, coated conductors, critical current, thickness dependence, MOCVD process, high rate process, long conductors, homogeneity, texture, cables three-in-one, current-voltage characteristics, ac losses, coils insert, magnets, review, YBCO, design parameters, power equipment, critical caracteristics, fabrication
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